Knowledge of the microscopic structure and composition of materials is essential for understanding their properties and designing functional devices. Microscopy techniques based on electrons and X ...

More information: Zetao Fan et al, Planar device–enabled speckle illumination for dark-field label-free imaging beyond the ...

Copper oxide nanoparticles imaged using the scanning transmission electron microscope detector in dark field mode. High-resolution energy dispersive X-ray phase map of the Murchison meteorite prepared ...