Teradyne has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, to announce the availability of the first high-volume, double-sided wafer probe test cell ...

Abstract: X-ray Diffraction (XRD) mapping is a non-destructive metrology technique that enables the reconstruction of warpage induced on a Silicon wafer through thermo-mechanical stress. Here, we ...

The shipment includes monocrystalline growth furnaces and control systems, which will support an annual output of 3 GW of monocrystalline silicon rods and 3 GW of silicon wafers. The facility is ...

the shipment includes monocrystalline growth furnaces and accompanying control systems, which will have an annual production output of 3 GW of monocrystalline silicon rods and 3 GW of silicon wafers.

This innovative solution is designed to meet the growing demand for high-throughput electro-optical testing of silicon photonic wafers driven by co-packaged optics (CPO) applications. The new test ...

The shipment includes monocrystalline growth furnaces and accompanying ... capacity of 3GW of monocrystalline silicon rods and 3GW of silicon wafers. This move signals the commencement of the ...

The shipment includes monocrystalline growth furnaces and accompanying control systems, which will be used to establish a high-tech facility with an annual production capacity of 3GW of ...

The monocrystalline growth furnaces included in the shipment employ the ... and intelligent manufacturing will focus on producing monocrystalline silicon rods and large-size silicon wafers, such as ...